Next Generation Sequencing Platforms

RTG Investigator sequence analysis software supports popular next generation sequencing instruments, natively integrating sequence data from Illumina, Complete Genomics, Ion Torrent and Roche 454 in NGS data analysis pipelines. Researchers who use deep sequencing in their genomic investigations can use this analysis software to quickly compare results from different next gen sequencing systems.

Illumina RTG provides sequencing analysis software for Illumina high throughput sequencing systems, including the HiSeq 2000. RTG’s sequencing alignment software aligns single-end and paired-end sequence data with read lengths from 36 to 150 bases and beyond. With RTG’s unique technology, the read mapping phase is simplified, integrating search, pairing, and alignment of paired end reads, improving both speed and accuracy.
Complete Genomics RTG maps and aligns paired reads from Complete Genomics raw sequence files and produces standard SAM format alignment data. This innovation allows researchers a wider range of options for re-mapping and downstream variant detection pipelines. RTG Investigator is the only means for a researcher to yield additional results from Complete Genomics data, when using in-house compute and bioinformatics resources.
Ion Torrent Ion PGM sequencing instruments target research and clinical applications in which users seek the fastest time to results, and speed and accuracy are critical.  RTG delivers against these expectations with support for Ion Torrent as a native data type, trimming low quality reads and applying platform-specific models for read error characteristics. RTG Investigator enables exome, amplicon and metagenomic sequencing applications with the Ion PGM.
Roche 454 RTG analysis software for 454 sequencing supports the longer, variable length reads of the Roche 454 instrument, within the same pipeline as Illumina sequence data. The RTG gapped aligner is an ideal solution for challenging biological applications that require high indel and mismatch tolerance in reference mapping and assembly.